| Description |
1 online resource : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Bibliography |
Includes bibliographical references and index. |
| Note |
Title from title details screen. |
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Print version record. |
| Summary |
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. |
| Contents |
Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- 1 Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications -- 1 Introduction -- 2 Time-Resolved Transmission Electron Microscopy: Timescales and Concepts -- 2.1 Ultrafast Dynamics in Condensed Matter: Important Timescales -- 2.2 Time-Resolved Transmission Electron Microscopy: In-Situ TEM, Dynamic TEM, and Ultrafast TEM -- 2.3 Electron Sources in Conventional TEMs -- 2.4 Generation of Ultrashort Electron Pulses -- 3 Time-Resolved Transmission Electron Microscopy: Historical Development, Instrumental Aspects -- 3.1 Introduction -- 3.2 Oleg Bostanjoglo, Pioneer of High-Speed Transmission Electron Microscopy -- 3.3 Dynamic Transmission Electron Microscopy at the Lawrence Livermore National Laboratory -- Movie-Mode DTEM -- 3.4 Time-Resolved TEM with Atomic Scale Spatial Resolution and Femtosecond Time Resolution: The Development of Ultrafast Transmission Electron Microscopy at the California Institute of Technology -- 3.5 UTEM with High-Brightness Electron Sources: Development of a UTEM Based on a Laser-Driven Schottky Field Emission Gun in Göttingen -- 3.6 UTEM with High-Brightness Electron Sources: Development of a UTEM Based on a Laser-Driven Cold-Field Emission Gun in Toulouse -- 4 Applications of Ultrafast Transmission Electron Microscopy -- 4.1 Chemistry and Biology -- 4.2 Nanomechanics and Biomechanics -- 4.3 Nanomagnetism -- 4.4 Nano-Optics -- 5 Toward Time-Resolved Electron Holography with Femtosecond Electron Pulses -- 5.1 Introduction to Off-Axis Electron Holography -- 5.2 Relation Between the Contrast of the Electron Hologram and the Brightness of the Electron Source -- 5.3 Implications for Time-Resolved Electron Holography -- 6 Conclusion -- Acknowledgments -- References. |
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2 Re nement of Generalized Mean Inequalities and Connections with Divergence Measures -- 1 Introduction -- 1.1 Divergence and Distance Measures -- 1.2 Mean Divergence Measures -- 1.3 Parametric Generalizations -- 2 Combined Means Inequalities -- 2.1 Seven Means -- 2.2 Gini Mean of Order r and s -- 2.3 Combined Inequalities -- 2.4 Nonnegative Differences -- 2.5 Group I: Two Means Inequalities -- 2.6 Group II: Three Means Inequalities -- 3 Two Means Inequalities -- 3.1 Equality Relations -- 3.2 Uni cation Results -- 4 Three Means Inequalities -- 4.1 Equality Relations -- 4.2 Uni cation Results -- 5 General Theorem -- 5.1 Equality Relations -- 6 Final Remarks -- References -- 3 The Optical Transfer Theory of the Electron Microscope: Fundamental Principles and Applications -- 1 The Problem of Image Formation in the Electron Microscope -- 2 Symbols and De nitions -- Numerical Data -- 2.1 Symbols and De nitions (See Fig. 1) -- 2.2 Numerical Values -- 3 The Illumination -- 3.1 Fundamentals -- 3.2 Coherent, Partially Coherent, and Incoherent Illumination -- 3.3 The Equation for the Incident Wave -- 4 The Electron Microscopical Object -- 4.1 De nition of the Object Transparency -- 4.2 Amplitude Object and Phase Object -- 4.3 Fourier Representation of the Object Transparency -- 4.4 Diffraction at the Object -- 4.5 The In uence of the Object Thickness (a Purely Geometrical Consideration) -- 4.6 Inadequacy of the Concept "Transparency" for Thick Objects -- 4.7 The Object Modulation -- 4.8 The Strong Phase Object -- 4.9 The Weak Phase Object -- 4.10 The Strong and the Weak Amplitude Object -- 4.11 The Weak Object with Amplitude and Phase Components -- 4.12 A Particular Relationship Between Modulation and Diffraction of a Weak Object -- 5 The Formation of the Optical Image -- 5.1 Fundamental Problems -- 5.2 Introduction of Transfer Functions -- 5.3 Linear Transfer. |
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5.4 The Imaging of Amplitude and Phase of the Object Wave Function and of the Object Intensity into the Image Intensity -- 5.5 The Physics of the Imaging Process -- 5.6 Interpretation of the Filter Equation -- 5.7 Use of the Sampling Theorem -- 5.8 In uence of Lens Aberrations in the Geometric-Optical Treatment -- 5.9 The Wave Aberration -- 5.10 Phase Shifts and Masking Effects in the Diffraction Plane -- 5.11 The Amplitude-Contrast and Phase-Contrast Transfer-Functions of the Electron Microscope -- 5.12 Discussion of Table 2 -- 5.13 Supplementary Comments on the Imaging of Two-Dimensional Objects -- 5.14 Summary and Conclusions -- 6 Contrast by Means of Phase Shift: The Contrast Transfer-Functions for Axial Illumination -- 6.1 The Pupil Function -- 6.2 The Contrast Transfer-Functions in the Absence of a Mask -- 6.3 The Effect of Axial Astigmatism -- 6.4 Current and Voltage Fluctuations and the Energy Width of the Illuminating Beam -- 6.5 Experimental Con rmation of the Transfer Theory -- 6.6 Limitation of the Objective Aperture -- 6.7 Absorption Plates -- 6.8 Weakening of the Undiffracted Beam -- 6.9 Phase Plates -- 6.10 Reconstruction of Electron Micrographs by Light Optical Methods -- 6.11 Information Gain by Evaluating Focal Series: Using Complementary Objective Diaphragms -- 7 Contrast by Means of Phase Shift: Contrast Transfer Functions for Oblique Illumination -- 7.1 Without Masking -- 7.2 Elimination of One Side of the Diffraction Pattern -- 7.3 Practical Applications -- 8 The Problem of Point Resolution -- 8.1 The Concepts of Contrast Transfer and Resolution Limit -- 8.2 De nition of Point Resolution -- 8.3 Transfer-Theoretical Treatment of Point Resolution -- 8.4 Practical Consequences -- 9 Aperture Contrast -- 9.1 Comparison Between Contrast by Phase Shift and Aperture Contrast -- 9.2 An Example for Aperture Contrast. |
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9.3 Spurious Structures -- 10 Contrast Transfer for Partially Coherent and for Incoherent Illumination -- 10.1 Partially Coherent Illumination -- 10.2 Incoherent Illumination -- 11 Test Objects -- 12 Historical Remarks -- Acknowledgments -- References -- Index -- Back Cover. |
| Subject |
Electrons.
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Image processing.
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Optoelectronic devices.
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Optical data processing.
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Electrons |
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Électrons.
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Traitement d'images.
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Dispositifs optoélectroniques.
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Traitement optique de l'information.
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image processing.
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SCIENCE -- Physics -- Electricity.
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SCIENCE -- Physics -- Electromagnetism.
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Electrons
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Image processing
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Optical data processing
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Optoelectronic devices
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| Added Author |
Hawkes, P. W., editor.
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| ISBN |
9780128155417 (electronic bk.) |
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0128155418 (electronic bk.) |
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9780128152157 (print) |
| Standard No. |
AU@ 000066386557 |
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