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Title Advances in imaging and electron physics. Volume 150 / edited by Peter W. Hawkes.

Imprint Amsterdam ; Boston : Elsevier/Academic Press, ©2008.

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Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource (1 volume)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Advances in imaging and electron physics ; 150
Bibliography Includes bibliographical references and index.
Note Print version record.
Summary Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
Contents *I. Daubechies, G. Tesche and L. Vese, On some iterative concepts for image restoration; *R.F.W. Pease, Significant advances in scanning electron microscopy; 1965-2007; *J. M. Rodenburg, Ptychography and related diffractive imaging methods; *J. Serra, Advances in mathematical morphology: segmentation
Language English.
Subject Optoelectronic devices.
Optical data processing.
Dispositifs optoélectroniques.
Traitement optique de l'information.
TECHNOLOGY & ENGINEERING -- Imaging Systems.
Optical data processing
Optoelectronic devices
Added Author Hawkes, Peter W.
Other Form: Print version: Advances in imaging and electron physics. Volume 150. Amsterdam ; Boston : Elsevier/Academic Press, ©2008 9780123742179 012374217X (OCoLC)191752286
ISBN 9780080569123 (electronic bk.)
0080569129 (electronic bk.)
9780123742179 (electronic bk.)
012374217X (electronic bk.)
1281272884
9781281272881
9786611272883
6611272887
Standard No. AU@ 000056660404
CDX 8375311
CHBIS 010355191
CHVBK 329766759
DEBSZ 405319193
UKMGB 017585343

 
    
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