| Description |
1 online resource (286 pages). |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Issn Series |
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Issn Series.
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| Contents |
Intro -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- Chapter One: Novel theory of the structure of elementary particles -- 1. Introduction -- 2. Relativistic wave equation -- 3. Pseudo-hyperspherical coordinates -- 4. Four-dimensional angular momentum -- 5. Photon and massless quarks (quarkinos) -- 6. Four-dimensional scalar potentials -- 7. Neutrinos -- 8. Massive two-component systems -- 9. Electron and positron -- 10. Propagation in free space -- 11. Electron propagating in the electromagnetic field -- 12. The hydrogen atom revisited -- 13. Lamb shift -- 14. The proton problem -- 15. Conclusions -- Appendix A. Four-dimensional vector and tensor analysis -- A.1. Introduction -- A.2. Dyadic four-dimensional gradient acting on vectors and tensors -- A.3. Derivation of Maxwell´s equations -- Appendix B. Space-time rotation and Lorentz transformations -- References -- Chapter Two: Electron diffractive optics based on the magnetic Aharonov-Bohm effect -- 1. Introduction -- 2. Interference as confinement in Lorentzian wells -- 3. Diffractive description of the Aharonov-Bohm effect -- 4. The electron beam spatial modulator -- 5. Summary and conclusions -- Acknowledgments -- References -- Chapter Three: Electronic image recording in conventional electron microscopy -- 1. Introduction -- 2. Theoretical fundamentals -- 2.1. Detection quantum efficiency -- 2.2. Single-electron response -- 2.3. Signal amplification by quantum conversion stages -- 2.4. Background influence -- 2.5. Target readout -- 2.5.1. Analog mode -- 2.5.2. Normalization mode -- 2.6. Storage -- 2.6.1. Analog systems -- 2.6.2. Digital storage -- 3. TV-image intensifier designs -- 3.1. Direct converting targets with beam readout -- 3.2. Channel plates -- 3.3. Transmission fluorescent screen as input stage -- 3.4. Image intensifier tubes. |
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3.5. Camera tubes -- 3.6. Solid state converters -- 4. Primary pulse height distribution of scintillators -- 4.1. Backscattering -- 4.2. Light absorption -- 4.3. Energy dependence of the DQE -- 4.3.1. E0100 keV -- 4.3.2. E0100 keV -- 5. Single image storage -- 5.1. Analog storage system -- 5.2. Digital storage systems -- 6. Storage of image series -- 7. Image processing -- 8. Concluding remarks -- Acknowledgments -- Appendix -- Calculation of the DQE limit for the normalization mode -- References -- Chapter Four: The phase problem in electron microscopy -- 1. Introduction -- 2. Indirect methods for solving the phase problem -- 2.1. Weak phase approximation using electron diffraction data -- 2.2. Weak phase-weak amplitude approximation using two electron micrographs -- 3. Direct methods for solving the phase problem -- 3.1. Electron diffraction and electron image data -- 3.2. Two images recorded at different defocus -- 3.3. Bright-field and dark-field images -- 3.4. Complementary half-plane aperture images -- 4. Uniqueness of the phase solution -- 4.1. Bright-field microscopy -- 4.2. Dark-field microscopy -- 4.3. Use of other information to restrict phase solutions -- 5. Holography and the electron microscope -- 5.1. Normal bright-field microscopy -- 5.2. Bright-field microscopy with tilted illumination -- 5.3. Bright-field microscopy with complementary half-plane objective apertures -- 5.4. Optical reconstruction of electron micrographs -- 6. Practical problems in phase determination -- 6.1. Radiation damage and specimen preparation -- 6.2. Use of specimens with repeating units -- 6.3. Instrumental problems -- 6.4. Inelastic electron scattering -- 7. Interpretation and use of phase information -- 7.1. Weak phase object -- 7.2. Weak phase-weak amplitude object -- 7.3. A thick (stained) specimen -- 7.4. Resolving single heavy atoms. |
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8. Discussion on phase determination and refinement techniques -- Acknowledgments -- References -- Author index -- Subject index. |
| Summary |
Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics. |
| Bibliography |
Includes bibliographical references and index. |
| Note |
Description based on print version record. |
| Subject |
Optical data processing.
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Optoelectronic devices.
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Traitement optique de l'information.
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Dispositifs optoélectroniques.
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| Added Author |
Hawkes, P. W., editor.
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Htch, Martin, editor.
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| ISBN |
9780443193262 |
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0443193266 |
| Standard No. |
AU@ 000074359224 |
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