| Description |
1 online resource |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in Imaging and Electron Physics ; v. 211 |
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Advances in imaging and electron physics ; v. 211.
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| Note |
Includes index. |
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Title details screen. |
| Contents |
Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- 1 Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons -- 1 Introduction -- 2 Image formation in the transmission electron microscope -- 2.1 Modeling the TEM -- 2.2 A short introduction to the Dirac equation -- 2.3 Mathematics of the imaging process -- 2.3.1 Pre-specimen -- 2.3.2 Post-specimen -- 3 The multislice method -- 3.1 The conventional multislice algorithm -- 3.1.1 Algorithm for elastically scattered electrons -- 3.1.2 Incorporating inelastically scattered electrons -- 3.2 A relativistic multislice algorithm -- 3.2.1 The Dirac equation in its two-component form -- 3.2.2 Algorithm for elastically scattered electrons -- 3.2.3 The relativistic Yoshioka equations -- 3.2.4 Incorporating inelastically scattered electrons -- 3.3 Transition potentials of atomic inner-shell ionizations -- 3.3.1 Conventional result -- 3.3.2 Relativistic result -- 4 Implementation -- 4.1 The incident wave function -- 4.2 Elastic electron scattering -- 4.3 Inner-shell ionizations -- 4.3.1 The transition function -- 4.3.2 The projected transition potential -- 4.3.3 Radial wave functions of the atomic electron -- 4.4 Electron-phonon scattering -- 4.5 Convergence of the incident electron beam -- 5 Results and discussion -- 5.1 Comparisons to single atom calculations -- 5.1.1 Ratio of ionization cross sections -- 5.1.2 Inelastic transfer function -- 5.2 Simulation of EFTEM elemental maps -- 5.2.1 Dipole-forbidden transitions -- 5.2.2 Elemental maps of SrTiO3[110] -- 5.2.3 Elemental maps of Si[110] -- 5.3 A simpler relativistic multislice algorithm -- 5.3.1 A simpler transmission function -- 5.3.2 A simpler transition function -- 5.3.3 The simpli ed algorithm -- 5.4 Impact of the electron spin. |
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Acknowledgment -- References -- 3 Electron energy loss spectroscopy in the electron microscope -- 1 Introduction -- 2 Fundamentals of inelastic scattering -- 2.1 General instrumental considerations -- 2.2 Some useful de nitions -- 2.3 The physics of elementary excitations -- 2.3.1 General classi cation -- 2.3.2 The recovery of single loss spectra -- 3 The low-energy loss region: plasmons and interband transitions -- 3.1 Energy dependence -- 3.2 Angular dependence -- 4 High-energy loss region: inner shell excitations -- 4.1 Bethe theory for inelastic scattering by an isolated atom -- 4.1.1 Angular distribution -- 4.1.2 Energy distribution -- 4.1.3 Partially integrated cross-sections -- 4.2 Fine structures due to various solid-state effects -- 4.2.1 Generalities -- 4.2.2 Chemical shift and edge shape -- 4.2.3 Band structure effects and ELNES -- 4.2.4 Extended ne structures (EXELFS) -- 4.3 Some problems in the intermediate energy loss domain -- 4.3.1 Background -- 4.3.2 Core loss excitations in the 20-50 eV energy loss domain -- 5 Developments in instrumentation -- 5.1 Classi cation of various systems -- 5.1.1 CTEM with energy-loss lters -- 5.1.2 STEM with energy-loss spectrometers -- 5.2 The scanning transmission microscope -- 5.3 Spectrometer design and coupling -- 5.3.1 Qualities of a spectrometer: Theory and application -- 5.3.2 Coupling of the spectrometer to the microscope column -- 5.4 Detection unit -- 5.5 Data acquisition and processing -- 6 EELS as a microanalytical tool -- 6.1 Qualitative microanalysis -- 6.1.1 Library of useful edges -- 6.1.2 Examples of applications -- 6.2 Quantitative microanalysis -- 6.2.1 De nitions: Signal and cross-section -- 6.2.2 Specimen induced effects -- 6.3 Detection limits -- 6.3.1 Minimum detectable mass -- 6.3.2 Minimum detectable mass fraction (MMF) -- 6.4 Environmental information. |
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6.5 Chemical mapping with energy ltered images -- 7 Miscellaneous -- 7.1 Electron energy loss spectroscopy in high voltage microscopy -- 7.2 Energy ltered images -- 7.3 Energy losses on surfaces at glancing incidence -- Acknowledgements -- Post scriptum -- References -- Further reading -- Index -- Back Cover. |
| Subject |
Electrons.
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Image processing.
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Optoelectronic devices.
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Optical data processing.
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Électrons.
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Traitement d'images.
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Dispositifs optoélectroniques.
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Traitement optique de l'information.
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image processing.
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Electrons
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Image processing
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Optical data processing
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Optoelectronic devices
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| Added Author |
Hawkes, P. W., editor.
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Htch, Martin, editor.
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| ISBN |
9780128174692 (print) |
| Standard No. |
AU@ 000067742274 |
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AU@ 000068482225 |
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