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Author Graham, Rebekah L.

Title A novel approach for correlating capacitance data with performance during thin-film device stress studies [electronic resource] : preprint / R.L. Graham and D.S. Albin, National Renewable Energy Laboratory, [and] L.A. Clark, Primestar Solar.

Imprint Golden, CO : National Renewable Energy Laboratory, [2011]

Copies

Location Call No. OPAC Message Status
 Axe Federal Documents Online  E 9.17:NREL/CP-5200-52392    ---  Available
Description 1 online resource (8 p.) : ill. (some col.)
Series NREL/CP ; 5200-52392
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-52392.
System Details Full text available via Internet in .pdf format. Adobe Acrobat Reader required.
Note Title from title screen (viewed September 19, 2011).
"August 2011."
"Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."
Bibliography Includes bibliographical references (p. 8).
Summary A new data mining algorithm was developed to identify the strongest correlations between capacitance data (measured between -1.5 V and +0.49 V) and 1st and 2nd level performance metrics (efficiency, open-circuit voltage (VOC), short-circuit current density (JSC), and fill-factor (FF)) during the stress testing of voltage-stabilized CdS/CdTe devices. When considering only correlations between 1st and 2nd level metrics, 96.5% of the observed variation in efficiency was attributed to FF. The overall decrease in VOC after 1000 hours of open-circuit, light-soak stress at 60 degrees C was about 1.5%. As determined by our algorithm, the most consistent correlation existing between FF and 3rd level metric capacitance data at all stages during stress testing was between FF and the apparent CdTe acceptor density (Na) calculated at a voltage of +0.49 V during forward voltage scans. Since the contribution of back contact capacitance to total capacitance increases with increasing positive voltage, this result suggests that FF degradation is associated with decreases in Na near the CdTe/back contact interface. Also of interest, it appears that capacitance data at these higher voltages appears to more accurately fit the one-sided abrupt junction model.
Funding Sponsored by National Renewable Energy Laboratory DE-AC36-08GO28308
Subject Photovoltaic cells -- Research.
Solar cells -- Testing.
Electric capacity.
Thin films -- Performance.
Data mining -- Computer programs.
Added Author Albin, David S.
Clark, Laura A.
National Renewable Energy Laboratory (U.S.)
Primestar Solar (Firm)
SPIE Optics and Photonics Conference (2011 : San Diego, Calif.)
Gpo Item No. 0430-P-04 (online)
Sudoc No. E 9.17:NREL/CP-5200-52392

 
    
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