In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
"2020 Photovoltaic Reliability Workshop, Denver, CO 2/25/2020 - 2/27/2020"--Page 1.
Funding
DE-AC36-08GO28308
Note
Description based on online resource; title from PDF caption (NREL, viewed March 6, 2023).
Summary
New and previously undiscovered degradation mechanisms continue to be identified after field exposure in new photovoltaic module designs or materials oftentimes results in significant losses in investment. This is despite passing certification tests. Testing is insufficient largely due to their single-or double-stress nature. A Combined-Accelerated Stress Test (C-AST) has recently been developed. The test combines multiple stress factors of the natural environment to better replicate conditions experienced by modules in the field and detect mechanisms not a-priori known in new materials and designs.
