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Subjects (1-2 of 2)
Reliability Metal Oxide Semiconductors Complementary
1
Transient-induced latchup in CMOS integrated circuits
Ker, Ming-Dou.
Singapore ; Hoboken, NJ : Wiley, c2009. 2009
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Axe ProQuest E-Book
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Reliability Microelectromechanical Systems
2
Reliability of MEMS testing of materials and devices
Weinheim : Wiley-VCH, 2013. 2013
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