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Title Strength of Si wafers with microcracks [electronic resource] : a theoretical model / Przemyslaw (Peter) Rupnowski and Bhushan Sopori.

Imprint

Washington, D.C. : United States. Dept. of Energy ; Oak Ridge, Tenn. : distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2008.

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Connect to https://permanent.fdlp.gov/gpo25039/43306.pdf

Copies

Location	Call No.	OPAC Message	Status
Axe Federal Documents Online	E 9.28:NREL/PO-520-43306	---	Available

Description	1 p. : col. ill.
Series	NREL/PO ; 520-43306
	NREL/PO ; 520-43306.
Note	Title from title screen (viewed on July 9, 2012).
	"Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California."
	"This work was supported by the U.S. Department of Energy under Contract No. DE-AC36-99GO10337 with the National Renewable Energy Laboratory."
	"NREL is operated by Midwest Research Institute, Batelle."
Subject	Semiconductor wafers -- Research.
	Photovoltaic cells -- Research.
Added Author	Sopori, B.
	Rupnowski, P.
	United States. Department of Energy.
	United States. Department of Energy. Office of Scientific and Technical Information.
	IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.)
	National Renewable Energy Laboratory (U.S.)
Gpo Item No.	0430-P-17 (online)
Sudoc No.	E 9.28:NREL/PO-520-43306