| Description |
1 online resource (7 p.) : ill. |
| Series |
NREL/CP-5200-47755 |
|
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-47755.
|
| System Details |
Full text available via Internet in .pdf format. Adobe Acrobat Reader required. |
| Note |
Title from title screen (NREL, viewed Nov. 8, 2010). |
|
"October 2010." |
|
"Presented at the 35th IEEE Photovoltaic Specialists Conference, Honolulu, Hawaii, June 20-25, 2010." |
| Summary |
Accelerated lifetime testing of five crystalline silicon module designs was carried out according to the Terrestrial Photovoltaic Module Accelerated Test-to-Failure Protocol. This protocol compares the reliability of various module constructions on a quantitative basis. The modules under test are subdivided into three accelerated lifetime testing paths: 85 degreesC/85% relative humidity with system bias, thermal cycling between -40 degreesC and 85 degreesC, and a path that alternates between damp heat and thermal cycling. Ability to withstand electrolytic corrosion, moisture ingress, and ion drift under system voltage bias are differentiated according to module design. The results are discussed in light of relevance to field failures. |
| Bibliography |
Includes bibliographical references. |
| Funding |
DE-AC36-08-GO28308. PVD9.1320 |
| Subject |
Solar cells -- Materials -- Testing -- Congresses.
|
|
Photovoltaic cells -- Materials -- Testing -- Congresses.
|
|
Weathering -- Congresses.
|
| Added Author |
National Renewable Energy Laboratory (U.S.)
|
|
IEEE Photovoltaic Specialists Conference.
|
| Added Title |
Test to failure of crystalline silicon modules |
| Gpo Item No. |
0430-P-04 (online) |
| Sudoc No. |
E 9.17:NREL/CP-5200-47755 |
|
