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Author Bhushan, Manjul.

Title Microelectronic test structures for CMOS technology [electronic resource] / Manjul Bhushan, Mark B. Ketchen.

Imprint New York : Springer, c2011 (Norwood, Mass. : [generator])


Location Call No. OPAC Message Status
 Axe Engineering Pro E-Book  Electronic Book    ---  Available
System Details Mode of access: Internet via World Wide Web.
Note Title from title screen.
File Type Text.
Issued By Digitized and made available by:
Form Available also in a print ed.
Bibliography Includes bibliographical references and index.
Subject Metal oxide semiconductors, Complementary.
Microelectronics -- Testing.
Solid state electronics -- Testing.
Genre/Form Electronic books.
Added Author Ketchen, Mark B. Author.
Books24x7, Inc.
ISBN 9781441993762 (hard cover : alk. paper)
9781441993779 (electronic )

Available items only