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Subjects (1-2 of 2)
Thin Film Circuits
1
Capacitance cell measurement of the out-of-plane expansion of thin films
Snyder, Chad R.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001] 2001
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Axe Federal Documents Online
C 13.10:960-7
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2
Thin film technology
Berry, Robert W.
Princeton, N.J. : Van Nostrand, [1968] 1968
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Axe 2nd Floor Stacks
621.38171 B459t
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