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Ultra Large Scale Integration Integrated Circuits
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Advanced interconnects for ULSI technology



Chichester, West Susex : Wiley, 2012. 2012

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Electromigration in ULSI interconnections


Tan, Cher Ming, 1959-
Hackensack, N.J. : World Scientific, c2010. 2010

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Electromigration in ULSI Interconnections international series on advances in solid state electronic


Tan, Cher Ming, 1959-
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., c2010 (Norwood, Mass. : Books24x7.com [generator]) 2010

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4
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New approaches to image processing based failure analysis of nano-scale ULSI devices


Zalevsky, Zeev.
Kidlington, Oxford ; Waltham, MA : William Andrew, 2014 (Norwood, Mass. : Books24x7.com [generator]) 2014

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