| Description |
1 online resource (xix, 338 pages) : illustrations. |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; 149 |
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Advances in imaging and electron physics ; 149.
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| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Summary |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Contents |
I. FIELD AND THERMIONIC EMISSION FUNDAMENTALS; A. A Note On Units; B. Free Electron Gas; C. Nearly Free Electron Gas; D. The Surface Barrier to Electron Emission; E. The Image Charge Approximation; II. THERMAL AND FIELD EMISSION; A. Current Density; B. Exactly Solvable Models; C. WKB zArea Under the Curve#x94; Models; D. Numerical Methods; E. The Thermal and Field Emission Equation; F. The Revised FN-RLD Equation and the inference of Work Function; from experimental data; G. Recent Revisions of the Standard Thermal an Field Models; H. The General Thermal-Field Equation; I. Thermal Emittance; III. PHOTOEMISSION; A. Background; B. Quantum Efficiency; C. The Probability of emission; D. Reflection and Penetration Depth; E. Conductivity; F. Scattering Rates; G. Scattering factor; H. Temperature of a Laser-illuminated Surface; I. Numerical Solution of the Coupled Thermal Equations; J. Revisions to the Modified Fowler Dubridge Model: Quantum Effects; K. Quantum Efficiency Revisited: A Moments-based Approach; L. The Quantum Efficiency of Bare Metals; M. The Emittance and Brightness of Photocathodes; IV. LOW WORK FUNCTION COATINGS AND ENHANCED EMISSION; A. Some History; B. A Simple Model of a Low Work Function Coating; C. A Less Simple Model of the Low Work Function Coating; D. The (Modified) Gyftopoulos-Levine Model of Work Function; Reduction; E. Comparison of the Modified Gyftopoulos-Levine Model to; Thermionic Data; F. Comparison of the Modified Gyftopoulos-Levine Model to; Photoemission Data; V. APPENDICES; A. Integrals related to Fermi-Dirac and Bose-Einstein Statistics; B. The Riemann Zeta function |
| Subject |
Electrons -- Emission.
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Electronics.
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Imaging systems.
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Image processing.
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Electronics |
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Émission électronique.
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Électronique.
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Imagerie (Technique)
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Traitement d'images.
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image processing.
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SCIENCE -- Physics -- Nuclear.
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SCIENCE -- Physics -- Atomic & Molecular.
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Electronics
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Electrons -- Emission
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Image processing
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Imaging systems
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| Other Form: |
Print version: Jensen, Kevin L. Advances in imaging and electron physics. Volume 149, Electron emission physics. San Diego, Calif. : Academic Press, ©2007 9780123742070 0123742072 (OCoLC)171547297 |
| ISBN |
9780123742070 (electronic bk.) |
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0123742072 (electronic bk.) |
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9780080556833 (electronic bk.) |
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0080556833 (electronic bk.) |
| Standard No. |
CHBIS 010355190 |
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CHVBK 329744550 |
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DEBSZ 405332157 |
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UKMGB 017585220 |
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AU@ 000056664748 |
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AU@ 000076174929 |
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