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Author Mukherjee, Shubu.

Title Architecture design for soft errors / Shubu Mukherjee.

Imprint Amsterdam ; Boston : Morgan Kaufmann Publishers/Elsevier, ©2008.

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Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource (xxi, 337 pages) : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Summary This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.
Bibliography Includes bibliographical references and index.
Contents Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.
Note Print version record.
Language English.
Subject Integrated circuits.
Integrated circuits -- Effect of radiation on.
Computer architecture.
System design.
Computer systems -- Reliability.
Computers -- Reliability.
Integrated circuits -- Fault tolerance.
Fault-tolerant computing.
Systèmes informatiques -- Fiabilité.
Ordinateurs -- Fiabilité.
Logiciels -- Évaluation.
Circuits intégrés, Effets du rayonnement sur les.
Logiciels -- Fiabilité.
Circuits intégrés -- Tolérance aux fautes.
Tolérance aux fautes (Informatique)
Circuits intégrés.
Ordinateurs -- Architecture.
Conception de systèmes.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
Integrated circuits -- Fault tolerance
Fault-tolerant computing
Computers -- Reliability
Computer systems -- Reliability
Computer architecture
Integrated circuits
Integrated circuits -- Effect of radiation on
System design
Fehler
Halbleiterspeicher
Integrierte Schaltung
Softwarearchitektur
Softwarewartung
Other Form: Print version: Mukherjee, Shubu. Architecture design for soft errors. Amsterdam ; Boston : Morgan Kaufmann Publishers/Elsevier, ©2008 0123695295 9780123695291 (DLC) 2007048527 (OCoLC)176924795
ISBN 9780123695291
0123695295
9780080558325 (electronic bk.)
0080558321 (electronic bk.)
1281272760
9781281272768
9786611272760
6611272763
Standard No. AU@ 000059302599
CHNEW 001007770
DEBBG BV039829472
DEBBG BV042305758
DEBSZ 367750341
NZ1 13068805
NZ1 15189699
NZ1 15595958

 
    
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