| Description |
1 online resource (xiv, 213 pages) : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Contents |
Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index. |
| Summary |
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. |
| Access |
Use copy Restrictions unspecified star MiAaHDL |
| Reproduction |
Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL |
| System Details |
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL |
| Processing Action |
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL |
| Subject |
Integrated circuits -- Testing.
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Semiconductors -- Testing.
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Semi-conducteurs -- Essais.
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TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
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TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
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Integrated circuits -- Testing
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Semiconductors -- Testing
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| Other Form: |
Print version: Afshar, Amir. Principles of semiconductor network testing. Boston : Butterworth-Heinemann, ©1995 0750694726 9780750694728 (DLC) 95013386 (OCoLC)32275164 |
| ISBN |
9780080539560 (electronic bk.) |
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0080539564 (electronic bk.) |
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9780750694728 |
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0750694726 (hardcover ; alk. paper) |
| Standard No. |
AU@ 000051563924 |
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AU@ 000054163149 |
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CHBIS 005673092 |
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CHNEW 001007206 |
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CHVBK 167253964 |
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DEBBG BV039830647 |
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DEBBG BV042316077 |
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DEBBG BV043043878 |
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DEBBG BV043968348 |
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DEBSZ 405296924 |
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DEBSZ 422177709 |
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DEBSZ 485788470 |
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GBVCP 882749072 |
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NZ1 12432640 |
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NZ1 15191054 |
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