With vastly increased complexity and functionality in the "nanometer era" (i.e. hundreds of millions of transistors on one chip), increasing the performance of integrated circuits has become a challenging task. This is due primarily to the inevitable increase in the distance among circuit elements and interconnect design solutions have become the greatest determining factor in overall performance.
Contents
Chapter 1. Introduction -- Chapter 2. Manufacturing of 3-D Packaged Systems -- Chapter 3. 3-D Integrated Circuit Fabrication Technologies -- Chapter 4. Interconnect Prediction Models -- Chapter 5. Physical Design Techniques for 3-D ICs -- Chapter 6. Thermal Management Techniques -- Chapter 7. Timing Optimization for Two-Terminal Interconnects -- Chapter 8. Timing Optimization for Multi-Terminal Interconnects -- Appendix A: Enumeration of Gate Pairs in a 3-D IC --Appendix B: Formal Proof of Optimum Single Via Placement -- Appendix C: Proof of the Two-Terminal Via Placement Heuristic -- Appendix D: Proof of Condition for Via Placement of Multi-Terminal Nets -- References.
Bibliography
Includes bibliographical references (pages 289-303) and index.
