| Description |
1 online resource (xxxvi, 856 pages) : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
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text file |
| Series |
The Morgan Kaufmann series in systems on silicon |
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Morgan Kaufmann series in systems on silicon.
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| Summary |
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students. |
| Contents |
Introduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends. |
| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Language |
English. |
| Subject |
Systems on a chip -- Testing.
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Integrated circuits -- Very large scale integration -- Testing.
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Integrated circuits -- Very large scale integration -- Design.
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TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- VLSI & ULSI.
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TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Logic.
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COMPUTERS -- Logic Design.
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Systems on a chip -- Testing.
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Integrated circuits -- Very large scale integration -- Testing.
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Integrated circuits -- Very large scale integration -- Design.
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Integrated circuits -- Very large scale integration -- Design
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Integrated circuits -- Very large scale integration -- Testing
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VLSI
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| Genre/Form |
dissertations.
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Academic theses
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Academic theses.
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Thèses et écrits académiques.
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| Added Author |
Wang, Laung-Terng.
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Stroud, Charles E.
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Touba, Nur A.
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| Other Form: |
Print version: System-on-chip test architectures. Amsterdam ; Boston : Morgan Kaufmann Publishers, ©2008 9780123739735 012373973X (DLC) 2007023373 (OCoLC)140109577 |
| ISBN |
9780123739735 |
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012373973X |
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9780080556802 (electronic bk.) |
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0080556809 (electronic bk.) |
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1281100048 |
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9781281100047 |
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9786611100049 |
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6611100040 |
| Standard No. |
AU@ 000043178404 |
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AU@ 000051559577 |
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CHNEW 001007599 |
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DEBBG BV039829435 |
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DEBBG BV042305719 |
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DEBBG BV043045167 |
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DEBSZ 355395185 |
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DEBSZ 367750244 |
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DEBSZ 422156965 |
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GBVCP 785350330 |
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HEBIS 29146842X |
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NZ1 12541551 |
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NZ1 15189662 |
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NZ1 15595568 |
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AU@ 000060584723 |
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