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Author

Title Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules: preprint / Chun-Sheng Jiang [and 6 others].

Publication Info.

Golden, CO : National Renewable Energy Laboratory, August 2020.

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Description	1 online resource (5 pages) : color illustrations.
	text txt rdacontent
	computer c rdamedia
	online resource cr rdacarrier
Series	Conference paper / NREL ; NREL/CP-5K00-76041
	Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041.
Note	In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
	"August 2020."
	"Presented at the 47th IEEE Photovoltaic Specialists Conference (PVSC 47), June 15-August 21, 2020"--Cover.
Bibliography	Includes bibliographical references (page 5).
Funding	DE-AC36-08GO28308
Note	Description based on online resource; title from PDF title page (NREL, viewed February 23, 2021).
Subject	Electric resistance -- Measurement.
	Solar panels -- Technological innovations.
	Thin films -- Electric properties.
	Heterojunctions -- Research -- United States.
	Panneaux solaires -- Innovations.
	Hétérojonctions -- Recherche -- États-Unis.
	Electric resistance -- Measurement
	Thin films -- Electric properties
	United States https://id.oclc.org/worldcat/entity/E39PBJtxgQXMWqmjMjjwXRHgrq
Added Author	National Renewable Energy Laboratory (U.S.), issuing body.
	United States. Department of Energy, sponsoring body.
Gpo Item No.	0430-P-04 (online)
Sudoc No.	E 9.17:NREL/CP-5 K 00-76041