| Description |
1 online resource (xiv, 372 pages) : illustrations. |
|
text txt rdacontent |
|
computer c rdamedia |
|
online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; 111
|
| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Summary |
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Contents |
Front Cover -- Advances in Imaging and Electron Pahysics, Volume 106 -- Copyright Page -- Contents -- Contributors -- Preface -- Chapter 1. Effects of Radiation Damage on Scientific Charge Coupled Devices -- I. Introduction -- II. Device Structure and Operation -- III. Radiation Damage -- IV. Dark Current -- V. Charge Transfer Efficiency -- VI. Read Noise -- VII. Conclusions -- References -- Chapter 2. CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators -- I. Introduction to CAD for Microstrip Circulators. |
|
II. Ferrite Physical and Chemical Attributes Relevant to Microstrip Circulator Material Selection -- III. Processing of Ferrite Materials for Microstrip Circulator Structures -- IV. Microstrip Circulator Considerations for Modeling -- V. Setup Formulas for Numerical Evalution of Microstrip Circulators -- VI. Numerical Results and Comparison to Experiment for Microstrip Circulators -- VII. Conclusions -- References -- Chapter 3. Discrete Geometry for Image Processing -- I. Introduction -- II. Binary Digital Images -- III. Digital Topology -- IV. Discrete Geometry. |
|
V. Extensions in the 16-Neighborhood Space -- VI. Application to Vectorization -- VII. Conclusion -- References -- Chapter 4. Introduction to the Fractional Fourier Transform and Its Applications -- I. Introduction -- II. Notation and Definitions -- III. Fundamental Properties -- IV. Common Transform Pairs -- V. Eigenvalues and Eigenfunctions -- VI. Operational Properties -- VII. Relation to the Wigner Distribution -- VIII. Fractional Fourier Domains -- IX. Differential Equations -- X. Hyperdifferential Form -- XI. Digital Simulation of the Transform. |
|
XII. Applications to Wave and Beam Propagation -- XIII. Applications to Signal and Image Processing -- Acknowledgments -- References -- Chapter 5. Confocal Microscopy -- I. Resolution in Light Microscopy -- II. Calculating Optical Properties -- III. Principles of Confocal Microscopy -- IV. Improving the Axial Resolution -- V. Nonlinear Imaging -- VI. Aperture Filters -- VII. Axial Tomography -- VIII. Spectral Precision Distance Microscopy -- IX. Computational Methods -- X. Spinning Disks -- XI. Perspectives of Confocal Fluorescence Microscopy -- References -- Index. |
| Subject |
Imaging systems.
|
|
Electrons.
|
|
Imagerie (Technique)
|
|
Électrons.
|
|
Electrons
|
|
Imaging systems
|
| Added Author |
Hawkes, P. W.
|
| Added Title |
Imaging and electron physics |
| ISBN |
012014753X (electronic bk.) |
|
9780120147533 (electronic bk.) |
| Standard No. |
CHBIS 010355153 |
|
CHVBK 329740318 |
|
DEBSZ 405334095 |
|
DEBSZ 48246299X |
|
AU@ 000067741874 |
|
