Description |
1 online resource (xvi, 276 pages) : illustrations. |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
Series |
Advances in imaging and electron physics, 1076-5670 ; 134 |
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Advances in imaging and electron physics ; 134. 1076-5670
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Bibliography |
Includes bibliographical references and index. |
Summary |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
Note |
Print version record. |
Contents |
Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Circulant Matrix Representation of Feature Masks and Its Applications; Phase Problem and Reference-Beam Diffraction; Fractal Encoding; Morphologically Debiased Classifier Fusion: A Tomography-Theoretic Approach; index. |
Subject |
Image processing.
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X-ray crystallography.
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Fractals.
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Multisensor data fusion.
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Crystallography, X-Ray |
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Traitement d'images.
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Radiocristallographie.
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Fractales.
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Fusion multicapteurs.
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image processing.
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fractals.
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SCIENCE -- Physics -- Electromagnetism.
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SCIENCE -- Physics -- Electricity.
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Fractals
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Image processing
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Multisensor data fusion
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X-ray crystallography
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Added Author |
Hawkes, P. W.
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Other Form: |
Print version: Advances in imaging and electron physics. Volume 134. Amsterdam ; Boston : Elsevier Academic Press, ©2005 0120147769 (OCoLC)62362121 |
ISBN |
0080458408 (electronic bk.) |
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9780080458403 (electronic bk.) |
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0120147769 (electronic bk.) |
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9780120147762 (electronic bk.) |
Standard No. |
CHBIS 010355175 |
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CHVBK 329743597 |
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DEBSZ 405292643 |
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DEBSZ 430351275 |
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YDXCP 2499420 |
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UKMGB 017572918 |
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AU@ 000065074684 |
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