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Author Yavor, Mikhail.

Title Optics of charged particle analyzers / Mikhail Yavor.

Imprint Amsterdam ; Boston : Academic Press, 2009.


Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Edition 1st ed.
Description 1 online resource (xxiii, 381 pages) : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Advances in imaging and electron physics ; v. 157
Advances in imaging and electron physics ; 157.
Bibliography Included bibliographical references and index.
Contents Charged particles in electromagnetic fields -- Language of aberration expansions in charged particle optics -- Transporting charged particle beams in static fields -- Transporting charged particles in radiofrequency fields -- Static magnetic charged particle analyzers -- Electrostatic energy analyzers -- Mass analyzers with combined electrostatic and magnetic fields -- Time-of-flight mass analyzers -- Radiofrequency mass analyzers.
Note Print version record.
Summary Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians.
Subject Particles (Nuclear physics)
Electron optics.
Nuclear physics -- Instruments.
Particules (Physique nucléaire)
Optique électronique.
Physique nucléaire -- Instruments.
particle physics.
SCIENCE -- Physics -- Nuclear.
SCIENCE -- Physics -- Atomic & Molecular.
Electron optics
Nuclear physics -- Instruments
Particles (Nuclear physics)
Other Form: Print version: Yavor, Mikhail. Optics of charged particle analyzers. 1st ed. Amsterdam ; Boston : Academic Press, 2009 9780123747686 (OCoLC)311788385
ISBN 9780080912165 (electronic bk.)
0080912168 (electronic bk.)
9780123747686 (electronic bk.)
0123747686 (electronic bk.)
Standard No. CDX 10799004
AU@ 000055649173
CHBIS 005933443
CHBIS 010355198
CHVBK 169378977
CHVBK 32976022X
DEBSZ 405325673
DEBSZ 430758618
GBVCP 879382686
UKMGB 017549226

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