|
Integrated Circuits Design And Construction
|
Hu, Chenming, author.
Oxford : Woodhead Publishing, 2023.
2023
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Pavlidis, Vasilis F., 1976-
Amsterdam ; Boston : Morgan Kaufmann, ©2009.
2009
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Hurtarte, Jeorge S.
Amsterdam ; Boston : Elsevier/Newnes, 2007.
2007
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Design And Construction Safety Measures
|
Westwood, N.J. : Noyes Publications, ©1998.
1998
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Effect Of Radiation On
|
Mukherjee, Shubu.
Amsterdam ; Boston : Morgan Kaufmann Publishers/Elsevier, ©2008.
2008
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Fault Tolerance
|
Mukherjee, Shubu.
Amsterdam ; Boston : Morgan Kaufmann Publishers/Elsevier, ©2008.
2008
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Industry
|
Hurtarte, Jeorge S.
Amsterdam ; Boston : Elsevier/Newnes, 2007.
2007
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Materials
|
San Diego : Academic Press, ©1999.
1999
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Passivation
|
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Reliability
|
Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
1988
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Testing
|
Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
1988
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Afshar, Amir.
Boston : Butterworth-Heinemann, ©1995.
1995
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Ultra Large Scale Integration Testing
|
Zalevsky, Zeev.
Oxford : William Andrew, 2014.
2014
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Verification
|
Andrews, Jason R.
Amsterdam ; Boston : Elsevier, ©2005.
2005
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Meyer, Andreas (Andreas S.)
Amsterdam ; Boston : Newnes, 2003.
2003
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Fujita, Masahiro, 1956-
Amsterdam ; Boston : Morgan Kaufmann Publishers, ©2008.
2008
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Integrated Circuits Very Large Scale Integration
|
International Workshop on Algorithms and Parallel VLSI Architectures (3rd : 1994 : Louvain, Belgium)
Amsterdam ; New York : Elsevier, 1995.
1995
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Wanhammar, Lars.
San Diego, Calif. : Academic Press, ©1999.
1999
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Park Ridge, N.J. : Noyes Publications ; Norwich, N.Y. : William Andrew Pub., ©2001.
2001
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Hassan, Hassan, 1979-
Amsterdam ; Boston : Elsevier ; Burlington, MA : Morgan Kaufmann, ©2010.
2010
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
London : ISTE Press ; Oxford : Elsevier Ltd, 2015.
2015
Rating:
Axe Elsevier ScienceDirect Ebook
|
Electronic Book |
--- |
Available |
|
Add Marked to Bag
Add All On Page
|