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Integrated Circuits Testing
1
Electronics reliability and measurement technology : nondestructive evaluation
Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988. 1988
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Axe Elsevier ScienceDirect Ebook
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2
Principles of semiconductor network testing
Afshar, Amir.
Boston : Butterworth-Heinemann, ©1995. 1995
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Integrated Circuits Ultra Large Scale Integration Testing
3
New approaches to image processing based failure analysis of nano-scale ULSI devices
Zalevsky, Zeev.
Oxford : William Andrew, 2014. 2014
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