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Engineering catastrophes : causes and effects of major accidents


Lancaster, J. F. (John Frederick)
Cambridge : Woodhead ; Boca Raton, FL : CRC Press, 2005. 2005

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Reliability and failure of electronic materials and devices


Ohring, Milton, 1936-
Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014. 2014

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Reliability and failure of electronic materials and devices


Ohring, Milton, 1936-
San Diego : Academic Press, ©1998. 1998

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Risk-based reliability analysis and generic principles for risk reduction


Todinov, M. T.
Amsterdam : Elsevier, 2007. 2007

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Root cause failure analysis


Mobley, R. Keith, 1943-
Boston : Newnes, ©1999. 1999

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