A planar near-field scanning technique for bistatic radar cross-section measurements [electronic resource] / S.R. Tuhela-Reuning and E.K. Walton.
Imprint
Columbus, Ohio : Ohio State University, ElectroScience Laboratary ; [Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, Va. : National Technical Information Service, distributor, 1990]
