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C, H, N and O in Si and Characterization and Simulation of Materials and Processes : Proceedings of

Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France)
Oxford : Elsevier Science, 1996. 1996

Passivation of metals and semiconductors, and properties of thin oxide layers : a selection of paper

International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers (9th : 2005 : Paris, France)
Amsterdam ; Oxford : Elsevier, 2006. 2006