| Description |
1 online resource (xv, 347 pages) : illustrations. |
|
text txt rdacontent |
|
computer c rdamedia |
|
online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics, 1076-5670 ; 135 |
|
Advances in imaging and electron physics ; 135. 1076-5670
|
| Bibliography |
Includes bibliographical references and index. |
| Summary |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Note |
Print version record. |
| Contents |
Cover -- front cover -- copyright -- table of contents -- Contributors -- Preface -- Future Contributions -- Optics, Mechanics, and Hamilton-Jacobi Skeletons -- I. INTRODUCTION -- II. PROPERTIES OF SKELETONS -- III. SKELETONIZATION TECHNIQUES -- IV. OPTICS, MECHANICS, AND HAMILTON-JACOBI SKELETONS -- V. HOMOTOPY-PRESERVING MEDIAL SETS -- VI. EXAMPLES -- VII. CONCLUSION -- ACKNOWLEDGMENTS -- REFERENCES -- Dynamic Force Microscopy and Spectroscopy -- I. INTRODUCTION TO DYNAMIC FORCE MICROSCOPY -- II. DYNAMIC FORCE MICROSCOPY IN AIR AND LIQUIDS -- III. NONCONTACT AFM IN VACUUM -- IV. DYNAMIC FORCE SPECTROSCOPY -- V. CONCLUSION -- ACKNOWLEDGMENTS -- REFERENCES -- Generalized Almost-Cyclostationary Signals -- I. INTRODUCTION -- II. HIGHER-ORDER CHARACTERIZATION -- III. LINEAR TIME-VARIANT TRANSFORMATIONS OF GACS SIGNALS -- IV. SAMPLING OF GACS SIGNALS -- V. TIME-FREQUENCY REPRESENTATIONS OF GACS SIGNALS -- APPENDICES -- A -- B -- C -- D -- REFERENCES -- Virtual Optical Experiments -- I. INTRODUCTION -- II. MODULATION OF THE REFRACTIVE INDEX -- III. MEASUREMENT TECHNIQUES -- IV. MODELING OPTICAL PROBING TECHNIQUES -- V. VIRTUAL EXPERIMENTS AND THE OPTIMIZATION STRATEGY -- VI. FREE CARRIER ABSORPTION MEASUREMENTS -- VII. INTERNAL LASER DEFLECTION MEASUREMENTS -- VIII. INTERFEROMETRIC TECHNIQUES -- IX. CONCLUSION AND OUTLOOK -- REFERENCES -- Index -- Last Page. |
| Subject |
Image processing.
|
|
Atomic force microscopy.
|
|
Spectrum analysis.
|
|
Cyclostationary waves.
|
|
Semiconductor lasers.
|
|
Traitement d'images.
|
|
Microscopie à force atomique.
|
|
Ondes cyclostationnaires.
|
|
Lasers à semi-conducteurs.
|
|
image processing.
|
|
SCIENCE -- Physics -- Electromagnetism.
|
|
SCIENCE -- Physics -- Electricity.
|
|
Atomic force microscopy
|
|
Cyclostationary waves
|
|
Image processing
|
|
Semiconductor lasers
|
|
Spectrum analysis
|
| Added Author |
Hawkes, P. W.
|
| Other Form: |
Print version: Advances in imaging and electron physics. Volume 135. Amsterdam ; Boston : Elsevier Academic Press, ©2005 0120147777 (OCoLC)62576776 |
| ISBN |
0080458548 (electronic bk.) |
|
9780080458540 (electronic bk.) |
|
0120147777 (electronic bk.) |
|
9780120147779 (electronic bk.) |
| Standard No. |
CHBIS 010355176 |
|
CHVBK 329744399 |
|
DEBSZ 405292554 |
|
DEBSZ 430351313 |
|
YDXCP 2491308 |
|
UKMGB 017572920 |
|
AU@ 000065074685 |
|
