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Title Damp-heat induced degradation of transparent conducting oxides for thin-film solar cells [electronic resource] : preprint / F.J. Pern ... [et al.].

Imprint Golden, Colo. : National Renewable Energy Laboratory, [2008]

Copies

Location Call No. OPAC Message Status
 Axe Federal Documents Online  E 9.17:NREL/CP-520-42525    ---  Available
Description 1 online resource (6 p.) : ill.
Series NREL/CP ; 520-42525
Conference paper (National Renewable Energy Laboratory (U.S.)) ; 520-42525.
Type Of Report Conference paper; 11-16 May 2008.
Note Title from title screen (viewed June 9, 2008).
"May 2008."
"Presented at the 33rd IEEE Photovoltaic Specialists Conference, San Diego, California, May 11-16, 2008."
"The submitted manuscript has been offered by an employee of the Midwest Research Institute (MRI), a contractor of the US Government under contract no. DE-AC36-99GO10337."
Summary The stability of intrinsic and Al-doped single- and bi-layer ZnO for thin-film CuInGaSe2 solar cells, along with Al-doped Zn1-xMgxO alloy and Sn-doped In2O3 (ITO) and F-doped SnO2, was evaluated by direct exposure to damp heat (DH) at 85 degrees C and 85% relative humidity. The results show that the DH-induced degradation rates followed the order of Al-doped ZnO and Zn1-xMgxO >> ITO > F:SnO2. The degradation rates of Al:ZnO were slower for films of higher thickness, higher substrate temperature in sputter-deposition, and with dry-out intervals. As inferred from the optical micro-imaging showing the initiation and propagation of degrading patterns and regions, the degradation behavior appears similar for all TCOs, despite the obvious difference in the degradation rate. A degradation mechanism is proposed to explain the temporal process involving thermal hydrolysis.
Bibliography Includes bibliographical references (p. 6).
Funding PVB76701.
Subject Photovoltaic cells -- Research.
Thin films.
Solar cells.
Added Author Pern, F. J. (Fu-Jann), 1952-
National Renewable Energy Laboratory (U.S.)
Gpo Item No. 0430-P-04 (online)
Sudoc No. E 9.17:NREL/CP-520-42525

 
    
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