| Description |
10 p. : digital, PDF file |
| Series |
Conference paper NREL/CP ; 520-45012 |
|
Conference paper (National Renewable Energy Laboratory (U.S.)) ; 520-45012.
|
| System Details |
Mode of access via the NREL web site. |
| Note |
Title from title screen (viewed April 2009). |
|
"February 2009." |
|
"To be presented at Semicon China 2009, Shanghai, China, March 17-19, 2009." |
| Summary |
Multicrystalline silicon wafers used for solar cells exhibit defect clusters--localized crystal defects in and near grains of some specific orientations. Defect clusters are also dominant sites for impurity precipitation, and they remain ungettered and unpassivated through the solar cell processing. This paper describes characteristics of defect clusters, and shows, through theory and experiment, that defect clusters typically lower cell efficiency by 3 to 4 absolute percentage points. To recover this efficiency loss, it is necessary to getter precipitated impurities. |
| Subject |
Solar cells -- Defects.
|
|
Photovoltaic cells -- Research.
|
| Added Author |
National Renewable Energy Laboratory (U.S.)
|
| Gpo Item No. |
0430-P-04 (online) |
| Sudoc No. |
E 9.17:NREL/CP-520-45012 |
|
