| Description |
1 online resource (4 p.) : ill. (chiefly col.) |
| Series |
NREL/CP ; 5200-50701 |
|
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50701.
|
| System Details |
Full text available via Internet in .pdf format. Adobe Acrobat Reader required. |
| Note |
Title from title screen (viewed August 1, 2011). |
|
"July 2011." |
|
"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011." |
| Summary |
Molybdenum (Mo) thin films were sputtered onto soda lime glass (SLG) substrates. The main variable in the deposition parameters, the argon (Ar) pressure pAr, was varied in the range of 6 - 20 mTorr. Ex situ spectroscopic ellipsometry (SE) was performed to find out that the dielectric functions of the Mo films were strongly dependent on pAr, indicating a consistent and significant decrease in the Mo film density pMo with increasing pAr. This trend was confirmed by high-angle-annular-dark-field scanning transmission electron microscopy. Dielectric functions of Mo were then found to be correlated with secondary ion mass spectroscopy profiles of Sodium (Na) in the Cu(InxGa1-x)Se2 (CIGS) layer grown on top of Mo/SLG. Therefore, in situ optical diagnostics can be applied for process monitoring and optimization in the deposition of Mo for CIGS solar cells. Such capability is demonstrated with simulated optical transmission and reflectance of variously polarized incident light, using dielectric functions deduced from SE. |
| Bibliography |
Includes bibliographical references (p. 4). |
| Funding |
DE-AC36-08GO28308 |
| Subject |
Photovoltaic cells -- Research.
|
|
Solar cells -- Design and construction.
|
|
Thin films.
|
| Added Author |
Li, Jian.
|
|
National Renewable Energy Laboratory (U.S.)
|
|
IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
|
| Gpo Item No. |
0430-P-04 (online) |
| Sudoc No. |
E 9.17:NREL/CP-5200-50701 |
|
