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Title Imaging study of multi-crystalline silicon wafers throughout the manufacturing process [electronic resource] : preprint / Steve Johnston ... [et al.].

Imprint

[Golden, CO] : National Renewable Energy Laboratory, [2011]

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Connect to https://www.nrel.gov/docs/fy11osti/50724.pdf
Connect to https://www.nrel.gov/docs/fy11osti/50724.pdf

Copies

Location	Call No.	OPAC Message	Status
Axe Federal Documents Online	E 9.17:NREL/CP-5200-50724	---	Available

Description	1 online resource (6 p.) : ill. (some col.)
Series	NREL/CP ; 5200-50724
	Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50724.
System Details	Full text available via Internet in .pdf format. Adobe Acrobat Reader required.
Note	Title from title screen (viewed August 8, 2011).
	"July 2011."
	"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
Summary	Imaging techniques are applied to multi-crystalline silicon bricks, wafers at various process steps, and finished solar cells. Photoluminescence (PL) imaging is used to characterize defects and material quality on bricks and wafers. Defect regions within the wafers are influenced by brick position within an ingot and height within the brick. The defect areas in as-cut wafers are compared to imaging results from reverse-bias electroluminescence and dark lock-in thermography and cell parameters of near-neighbor finished cells. Defect areas are also characterized by defect band emissions. The defect areas measured by these techniques on as-cut wafers are shown to correlate to finished cell performance.
Bibliography	Includes bibliographical references (p. 6).
Funding	DE-AC36-08GO28308
Subject	Photovoltaic cells -- Research.
	Silicon solar cells -- Research.
	Silicon solar cells -- Design and construction -- Testing.
	Photoluminescence.
Added Author	Johnston, Steve.
	National Renewable Energy Laboratory (U.S.)
	Colorado State University.
	Calisolar.
	IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
Added Title	Imaging study of multi crystalline silicon wafers throughout the manufacturing process
Gpo Item No.	0430-P-04 (online)
Sudoc No.	E 9.17:NREL/CP-5200-50724