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Conference International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)

Title ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.

Imprint Materials Park, Ohio : ASM International, 2011.

Copies

Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description xix, 456 p. : col. ill.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Electronics -- Materials -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing -- Congresses.
Genre/Form Electronic books.
Added Author ASM International.
Electronic Device Failure Analysis Society.
ProQuest (Firm)
ISBN 0615038263
9781615038268
9781615038503 (electronic bk.)

 
    
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