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Author
Cataldo, Giuseppe, author.
Title
Far-infrared dielectric functions : silicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si) / Giuseppe Cataldo, Edward J. Wollack.
Publication Info.
Greenbelt, MD : National Aeronautics and Space Administration, Goddard Space Flight Center, September 2020.
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Description
1 online resource (26 pages) : color illustration
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series
NASA/TM ; 20205007162
NASA technical memorandum ; 20205007162.
Note
"September 2020."
Bibliography
Includes bibliographical references (page 2).
Note
Online resource, PDF version; title from title page (NASA, viewed on October 21, 2020).
Subject
Numerical analysis.
Dielectrics.
Analyse numérique.
Diélectriques.
Dielectrics
Numerical analysis
Numerical analysis.
Dielectric properties.
Dielectrics.
Added Author
Wollack, Edward J., 1964- author.
Goddard Space Flight Center, issuing body.
Added Title
Silicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si)
Gpo Item No.
0830-D (online)
Sudoc No.
NAS 1.15:20205007162
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