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Capacitance cell measurement of the out-of-plane expansion of thin films

Snyder, Chad R.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001] 2001

Computing uncertainty for charpy impact machine test results

Splett, Jolene D.
Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2007 2007

Data evaluation theory and practice for materials properties

Munro, R. G. (Ronald Gordon)
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003] 2003

DTA and heat-flux DSC measurements of alloy melting and freezing

[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2006] 2006

Fractography of ceramics and glasses

Quinn, G. D. (George D.)
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2007. 2007

Measurement issues in single wall carbon nanotubes

Gaithersburg, Md. : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2008] 2008

Particle size characterization

Jillavenkatesa, Ajit.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2001] 2001

Pore characterization in low-k dielectric films using x-ray reflectivity x-ray porosimetry

[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2004] 2004

Porosity and specific surface area measurements for solid materials

Klobes, Peter.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology [2006] 2006

Rockwell hardness measurement of metallic materials

Low, Samuel R.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 2001] 2001

Stopwatch and timer calibrations

Gust, Jeff C.
[Boulder, Colo.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2009. 2009

Surface engineering measurement standards for inorganic materials

Dapkunas, Stanley J.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2005] 2005

Test procedures for developing solder data

NEMI Task Group on Lead-Free Alloys and Reliability.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2002] 2002

The use of nomenclature in dispersion science and technology

Hackley, Vincent A.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001] 2001

WWVB radio controlled clocks recommended practices for manufacturers and consumers

[Gaitherburg, Md.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009. 2009

WWVB radio controlled clocks : recommended practices for manufacturers and consumers

Lombardi, Michael A.
[Boulder, Colo.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2005. 2005

X-ray topography

Black, David R.
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2004] 2004