Particle size characterization [electronic resource] / Ajit Jillavenkatesa, Stanley J. Dapkunas, Lin-Sien H. Lum.
Imprint
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2001]
