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Title From modules to atoms : techniques and characterization for identifying and understanding device-level photovoltaic degradation mechanisms / Steve Johnston [and thirteen others].

Publication Info. Golden, CO : National Renewable Energy Laboratory, 2019.

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Description 1 online resource (x, 51 pages) : color illustrations.
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series NREL/TP ; 5K00-72541
NREL/TP ; 5K00-72541.
Note "October 2019."
Bibliography Includes bibliographical references.
Type Of Report Technical report.
Funding Contract No. DE-AC36-08GO28308
Note Description based on online resource; title from PDF title page (NREL, viewed on Sept. 8, 2020).
Summary This report documents how degraded modules are analyzed for the characterization of cell-level performance reduction. The primary degradation topics presented here are 1) potential-induced degradation, 2) defect metastability and impurity diffusion, and 3) partial-shading-induced reverse-bias breakdown. Imaging techniques, such as electroluminescence imaging, photoluminescence imaging, and lock-in thermography provide spatial information of full modules on the meter scale. Area of interest can then be imaged with higher spatial resolution by zooming in with fields of view near the mm scale. We document procedures for coring cell samples from selected regions of interest using mechanical drilling. The small samples are then of suitable size for various microscopic analyses using techniques such as scanning electron microscopy, time-of-flight secondary ion spectrometry, atomic force microscopy, electron beam induced current, transmission electron microscopy, and atom probe tomography, which can provide chemical, structural, and electrical characterization down to the atomic scale.
Subject Photovoltaic cells -- Reliability.
Cellules photovoltaïques -- Fiabilité.
Indexed Term cell-level
degradation
mechanisms
modules
photovoltaic
Genre/Form technical reports.
Technical reports (OCoLC)fst01941336
Technical reports.
Rapports techniques.
Added Author Johnston, Steve, author.
National Renewable Energy Laboratory (U.S.), issuing body.
Added Title Techniques and characterization for identifying and understanding device-level photovoltaic degradation mechanisms
Standard No. 1572277 OSTI ID
0000-0003-1574-3379
0000-0001-6368-521X
Gpo Item No. 0430-P-03 (online)
Sudoc No. E 9.16:NREL/TP-5 K 00-72541

 
    
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