Description |
1 online resource (x, 51 pages) : color illustrations. |
|
text txt rdacontent |
|
computer c rdamedia |
|
online resource cr rdacarrier |
Series |
NREL/TP ; 5K00-72541 |
|
NREL/TP ; 5K00-72541.
|
Note |
"October 2019." |
Bibliography |
Includes bibliographical references. |
Type Of Report |
Technical report. |
Funding |
Contract No. DE-AC36-08GO28308 |
Note |
Description based on online resource; title from PDF title page (NREL, viewed on Sept. 8, 2020). |
Summary |
This report documents how degraded modules are analyzed for the characterization of cell-level performance reduction. The primary degradation topics presented here are 1) potential-induced degradation, 2) defect metastability and impurity diffusion, and 3) partial-shading-induced reverse-bias breakdown. Imaging techniques, such as electroluminescence imaging, photoluminescence imaging, and lock-in thermography provide spatial information of full modules on the meter scale. Area of interest can then be imaged with higher spatial resolution by zooming in with fields of view near the mm scale. We document procedures for coring cell samples from selected regions of interest using mechanical drilling. The small samples are then of suitable size for various microscopic analyses using techniques such as scanning electron microscopy, time-of-flight secondary ion spectrometry, atomic force microscopy, electron beam induced current, transmission electron microscopy, and atom probe tomography, which can provide chemical, structural, and electrical characterization down to the atomic scale. |
Subject |
Photovoltaic cells -- Reliability.
|
|
Cellules photovoltaïques -- Fiabilité.
|
Indexed Term |
cell-level |
|
degradation |
|
mechanisms |
|
modules |
|
photovoltaic |
Genre/Form |
technical reports.
|
|
Technical reports (OCoLC)fst01941336
|
|
Technical reports.
|
|
Rapports techniques.
|
Added Author |
Johnston, Steve, author.
|
|
National Renewable Energy Laboratory (U.S.), issuing body.
|
Added Title |
Techniques and characterization for identifying and understanding device-level photovoltaic degradation mechanisms |
Standard No. |
1572277 OSTI ID |
|
0000-0003-1574-3379 |
|
0000-0001-6368-521X |
Gpo Item No. |
0430-P-03 (online) |
Sudoc No. |
E 9.16:NREL/TP-5 K 00-72541 |
|