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Author
Bahukudumbi, Sudarshan.
Title
Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
Imprint
Boston : Artech House, 2010.
Connect to
Available to Pittsburg State University patrons only.
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Location
Call No.
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Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
xv, 198 p. : ill.
Series
Artech House integrated microsystems series
Artech House integrated microsystems series.
Bibliography
Includes bibliographical references and index.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject
Integrated circuits -- Testing.
Integrated circuits -- Wafer-scale integration.
Semiconductors -- Testing.
Genre/Form
Electronic books.
Added Author
Chakrabarty, Krishnendu.
ProQuest (Firm)
ISBN
9781596939899
1596939893
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