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Record 35 of 35
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Author
Nelson, Wayne, 1936-
Title
Accelerated testing : statistical models, test plans and data analyses / Wayne Nelson.
Imprint
New York : Wiley, c1990.
Copies
Location
Call No.
OPAC Message
Status
Axe 2nd Floor Stacks
519.5 N338a
---
Available
Description
xiv, 601 p. : ill. ; 25 cm.
Series
Wiley series in probability and mathematical statistics. Applied probability and statistics
Note
"A Wiley-Interscience publication."
Bibliography
Includes bibliographical references (p. 561-577).
Subject
Failure time data analysis.
Reliability (Engineering) -- Statistical methods.
Accelerated life testing -- Statistical methods.
ISBN
0471522775
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