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Print Material
Author Hosmer, David W.

Title Applied logistic regression / David W. Hosmer, Stanley Lemeshow.

Imprint New York : Wiley, c2000.


Location Call No. OPAC Message Status
 Axe 2nd Floor Stacks  519.536 H794a 2000    ---  Available
Edition 2nd ed.
Description xii, 375 p. : ill. ; 25 cm.
Series Wiley series in probability and statistics. Texts and references section
Note "A Wiley-Interscience publication."
Bibliography Includes bibliographical references (p. 352-365) and index.
Subject Regression analysis.
Added Author Lemeshow, Stanley.
ISBN 0471356328 (cloth : alk. paper)

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